Item description for Infrared Characterization for Microelectronics by W. S. Lau, Richie Norton, Steve Cornett, Megan McKernan, Charles Nemfakos, Jose Cabot & Tim Ohr...
The focus of this text is on practical applications useful to the production line and to the research and development of microelectronics. The background knowledge and significance of doing a particular type of infrared measurement is discussed in detail. The principal purpose of the book is to serve as a useful handbook for practising engineers and scientists in the field of microelectronics.
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Studio: World Scientific Publishing Company
Est. Packaging Dimensions: Length: 0.75" Width: 6.25" Height: 9" Weight: 0.8 lbs.
Release Date Sep 1, 1999
Publisher World Scientific Publishing Company
ISBN 9810223528 ISBN13 9789810223526
Availability 0 units. This item is restricted to one per order.
More About W. S. Lau, Richie Norton, Steve Cornett, Megan McKernan, Charles Nemfakos, Jose Cabot & Tim Ohr