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Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices [Hardcover]

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Item description for Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices by Takashi Nakamura, Mamoru Baba, Eishi Yahagi, Hideaki Kameyama & Yasuo Yahagi...

Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices.

This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features.

Contents: Terrestrial Neutron Spectrometry and Dosimetry; Irradiation Testing in the Terrestrial Field; Neutron Irradiation Test Facilities; Review and Discussion of Experimental Data; Monte Carlo Simulation Methods; Simulation Results and Their Implications; International Standardization of the Neutron Test Method; Summary and Challenges.



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Item Specifications...


Studio: World Scientific Publishing Company
Pages   343
Est. Packaging Dimensions:   Length: 0.75" Width: 6" Height: 9.5"
Weight:   1.46 lbs.
Binding  Hardcover
Release Date   Mar 28, 2008
Publisher   World Scientific Publishing Company
ISBN  9812778810  
ISBN13  9789812778819  


Availability  0 units.


More About Takashi Nakamura, Mamoru Baba, Eishi Yahagi, Hideaki Kameyama & Yasuo Yahagi


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1Books > Subjects > Computers & Internet > Hardware > General
2Books > Subjects > Computers & Internet > Hardware
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