Item description for Advances in Scanning Probe Microscopy (Advances in Materials Research) by T. Sakurai...
This book covers several of the most important topics of current interest at the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future single-electron devices.
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Est. Packaging Dimensions: Length: 9.42" Width: 6.35" Height: 0.7" Weight: 1.5 lbs.
Release Date Apr 26, 2000
ISBN 3540667180 ISBN13 9783540667186
Availability 55 units. Availability accurate as of May 26, 2017 10:45.
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