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Advances in Scanning Probe Microscopy (Advances in Materials Research) [Hardcover]

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Retail Value $ 189.00  
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Item Number 226546  
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Item description for Advances in Scanning Probe Microscopy (Advances in Materials Research) by T. Sakurai...

This book covers several of the most important topics of current interest at the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future single-electron devices.



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Item Specifications...


Pages   341
Est. Packaging Dimensions:   Length: 9.42" Width: 6.35" Height: 0.7"
Weight:   1.5 lbs.
Binding  Hardcover
Release Date   Apr 26, 2000
Publisher   Springer
ISBN  3540667180  
ISBN13  9783540667186  


Availability  55 units.
Availability accurate as of Mar 29, 2017 03:11.
Usually ships within one to two business days from La Vergne, TN.
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Product Categories

1Books > Subjects > Professional & Technical > Engineering > Electrical & Optical > Semiconductors
2Books > Subjects > Professional & Technical > Engineering > Materials > General
3Books > Subjects > Professional & Technical > Engineering > Materials > Mechanical Properties of Solids
4Books > Subjects > Professional & Technical > Professional Science > Physics > General
5Books > Subjects > Professional & Technical > Professional Science > Physics > Solid State Physics
6Books > Subjects > Science > Experiments, Instruments & Measurement > Microscopes & Microsocopy
7Books > Subjects > Science > General
8Books > Subjects > Science > Physics > General



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Advances in Scanning Probe Microscopy  May 4, 2000
Advances in Scanning Probe Microscopy - very illuminating.
 

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