Item description for Noncontact Atomic Force Microscopy by S. Morita...
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
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Est. Packaging Dimensions: Length: 9.4" Width: 6.3" Height: 0.9" Weight: 1.6 lbs.
Release Date Sep 17, 2002
ISBN 3540431179 ISBN13 9783540431176