Item description for Positron Annihilation in Semiconductors: Defect Studies (Springer Series in Solid-State Sciences) by Reinhard Krause-Rehberg...
The subject of this book is the investigation of lattice imperfections in semiconductors by means of positron annihilation. A comprehensive review is given of the different positron techniques, whose application to various kinds of defects, e.g. vacancies, impurity-vacancy complexes and dislocations, is described. The sensitivity range of positron annihilation with respect to the detection of these defects is compared to that of other defect-sensitive methods. The most prominent results obtained with positrons in practically all important semiconductors are reviewed. A special chapter of the book deals with positron annihilation as a promising tool for many technological purposes. The theoretical background necessary to understand the experimental results is explained in detail.
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Est. Packaging Dimensions: Length: 9.52" Width: 6.46" Height: 0.77" Weight: 1.5 lbs.
Release Date May 21, 2003
ISBN 3540643710 ISBN13 9783540643715
Availability 101 units. Availability accurate as of May 26, 2017 11:14.
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