Item description for Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences) by Ludwig Reimer & P. W. Hawkes...
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
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Est. Packaging Dimensions: Length: 1.25" Width: 6.5" Height: 9.75" Weight: 1.95 lbs.
Release Date Oct 16, 1998
ISBN 3540639764 ISBN13 9783540639763
Reviews - What do customers think about Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences)?
A very good book Jul 21, 2008
This is one of the self-complete books on SEM and the related techniques for intermediate and advanced level of the SEM users or engineers. With a huge list of references, the book explains almost all of the details of instrumentation, electron beam optics, detector strategy, physics of electron-specimen interaction, and practical applications of SEM-based imaging/analyzing techniques.
While some of the references cited are German literatures, the book provides the best guide for the SEM techniques and the underlyiong physics for wide range of readers.