Item description for Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences) by Ludwig Reimer & P. W. Hawkes...
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Promise Angels is dedicated to bringing you great books at great prices. Whether you read for entertainment, to learn, or for literacy - you will find what you want at promiseangels.com!
Est. Packaging Dimensions: Length: 1.25" Width: 6.5" Height: 9.75" Weight: 1.95 lbs.
Release Date Oct 16, 1998
ISBN 3540639764 ISBN13 9783540639763
Availability 107 units. Availability accurate as of Oct 21, 2016 04:29.
Usually ships within one to two business days from La Vergne, TN.
Orders shipping to an address other than a confirmed Credit Card / Paypal Billing address may incur and additional processing delay.
Reviews - What do customers think about Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences)?
A very good book Jul 21, 2008
This is one of the self-complete books on SEM and the related techniques for intermediate and advanced level of the SEM users or engineers. With a huge list of references, the book explains almost all of the details of instrumentation, electron beam optics, detector strategy, physics of electron-specimen interaction, and practical applications of SEM-based imaging/analyzing techniques.
While some of the references cited are German literatures, the book provides the best guide for the SEM techniques and the underlyiong physics for wide range of readers.