Item description for Surfaces and their Measurement by David J. Whitehouse...
The importance of surface metrology has long been acknowledged in manufacturing and mechanical engineering, but has now gained growing recognition in an expanding number of new applications in fields such as semiconductors, electronics and optics. Metrology is the scientific study of measurement, and surface metrology is the study of the measurement of rough surfaces. In this book, Professor David Whitehouse, an internationally acknowledged subject expert, covers the wide range of theory and practice, including the use of new methods of instrumentation.
* Written by one of the world's leading metrologists * Covers electronics and optics applications as well as mechanical * Written for mechanical and manufacturing engineers, tribologists and precision engineers in industry and academia
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Est. Packaging Dimensions: Length: 9.1" Width: 6.2" Height: 1.6" Weight: 1.7 lbs.
Release Date Jan 1, 2002
ISBN 1903996015 ISBN13 9781903996010
Availability 0 units.
More About David J. Whitehouse
David J Whitehouse is Professor of Engineering Science and Chief Scientist at the University of Warwick, UK. Member or founder member of a number of international engineering learned and professional bodies, he is the author of 180 papers, 22 patents and four books. He is consultant to leading edge instrument manufacturers Taylor Hobson Ltd.
David J. Whitehouse has an academic affiliation as follows - University of Warwick, Coventry, UK.