Item description for Oxide Reliability: A Summary of Silicon Oxide Wearout, Breadown, and Reliability (Selected Topics in Electronics and Systems) by D. J. Dumin...
This book presents in summary the state of our knowledge of oxide reliability. The articles have been written by experts who are among the most knowledgeable in the field. The book will be an invaluable aid to reliability engineers and manufacturing engineers, helping them to produce and characterize reliable oxides. It can be used as an introduction for new engineers interested in oxide reliability, besides being a reference for engineers already engaged in the field.
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Studio: World Scientific Publishing Company
Est. Packaging Dimensions: Length: 0.75" Width: 6.5" Height: 9.75" Weight: 1.4 lbs.
Release Date Jan 31, 2002
Publisher World Scientific Publishing Company
ISBN 9810248423 ISBN13 9789810248420
Availability 0 units. This item is restricted to one per order.
Reviews - What do customers think about Oxide Reliability: A Summary of Silicon Oxide Wearout, Breadown, and Reliability (Selected Topics in Electronics and Systems)?
Oxide Reliability Review Mar 18, 2008
This book is a good compilation of several authoritative papers on the topic of oxide reliability. It is appropriate for graduate students as well as professionals working in the area of semiconductor device reliability. The book provides a comprehensive list of references, which is especially useful for students who are pursuing the topic in depth.