Item description for Applied Scanning Probe Methods V (NanoScience and Technology) by Bharat Bhushan...
This volume will examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004 and the second to fourth volumes in early 2006. The field is progressing so fast that there is a need for practically one volume every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. The chapters will be written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
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Est. Packaging Dimensions: Length: 9.4" Width: 6.2" Height: 0.8" Weight: 1.4 lbs.
Release Date Nov 10, 2006
ISBN 3540373152 ISBN13 9783540373155
Availability 0 units.
More About Bharat Bhushan
BHARAT BHUSHAN, PhD, DSc, is Ohio Eminent Scholar and Howard D. Winbigler Professor in the Department of Mechanical Engineering at The Ohio State University in Columbus, where he also serves as Director of the Computer Microtribology and Contamination Laboratory.
Bharat Bhushan currently resides in Columbus, in the state of Ohio. Bharat Bhushan was born in 1949 and has an academic affiliation as follows - Computer Microtribology and Contamination Laboratory, The Ohio State U.