Item description for Applied Scanning Probe Methods III: Characterization (NanoScience and Technology) by Bharat Bhushan...
Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes - which belong together - contributes further to the evolution of SPM techniques.
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Est. Packaging Dimensions: Length: 9.29" Width: 6.3" Height: 0.87" Weight: 1.59 lbs.
Release Date Apr 11, 2006
ISBN 3540269096 ISBN13 9783540269090
Availability 96 units. Availability accurate as of Feb 26, 2017 09:44.
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More About Bharat Bhushan
BHARAT BHUSHAN, PhD, DSc, is Ohio Eminent Scholar and Howard D. Winbigler Professor in the Department of Mechanical Engineering at The Ohio State University in Columbus, where he also serves as Director of the Computer Microtribology and Contamination Laboratory.
Bharat Bhushan currently resides in Columbus, in the state of Ohio. Bharat Bhushan was born in 1949 and has an academic affiliation as follows - Computer Microtribology and Contamination Laboratory, The Ohio State U.